National Patterns of Technology Accumulation: Use of Patent Statistics - Sciences Po Accéder directement au contenu
Chapitre D'ouvrage Année : 2004

National Patterns of Technology Accumulation: Use of Patent Statistics

Résumé

We use US Patent Statistics to depict national patterns of technology accumulation in Japan and EU countries. Two properties of country profiles are confirmed, namely, stability over time with a country and differentiation across countries. The main novelty introduced here is the combined analysis of overall technological advantage, performance in fast growing areas and impact. The results show that in many areas of technology in which EU countries have an overall relative advantage, their performance in the subfields of highest technological opportunity is weak. On the other hand, Japan seems to have a consistent level of performance both in aggregate and in fast growing areas.
Fichier non déposé

Dates et versions

hal-03610885 , version 1 (16-03-2022)

Identifiants

  • HAL Id : hal-03610885 , version 1
  • SCIENCESPO : 2441/7201

Citer

Lionel Nesta, Parimal Patel. National Patterns of Technology Accumulation: Use of Patent Statistics. Handbook of quantitative science and technology research. The use of publication and patent statistics in studies of S&T systems, Kluwer Academic Publishers, pp.531 - 552, 2004, 9781402027024. ⟨hal-03610885⟩

Collections

SCIENCESPO OFCE
10 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More