Skip to Main content Skip to Navigation
Book sections

National Patterns of Technology Accumulation: Use of Patent Statistics

Abstract : We use US Patent Statistics to depict national patterns of technology accumulation in Japan and EU countries. Two properties of country profiles are confirmed, namely, stability over time with a country and differentiation across countries. The main novelty introduced here is the combined analysis of overall technological advantage, performance in fast growing areas and impact. The results show that in many areas of technology in which EU countries have an overall relative advantage, their performance in the subfields of highest technological opportunity is weak. On the other hand, Japan seems to have a consistent level of performance both in aggregate and in fast growing areas.
Document type :
Book sections
Complete list of metadata

https://hal-sciencespo.archives-ouvertes.fr/hal-03610885
Contributor : Spire Sciences Po Institutional Repository Connect in order to contact the contributor
Submitted on : Wednesday, March 16, 2022 - 4:39:20 PM
Last modification on : Thursday, March 17, 2022 - 3:21:56 AM

Identifiers

  • HAL Id : hal-03610885, version 1
  • SCIENCESPO : 2441/7201

Collections

Citation

Lionel Nesta, Parimal Patel. National Patterns of Technology Accumulation: Use of Patent Statistics. Handbook of quantitative science and technology research. The use of publication and patent statistics in studies of S&T systems, Kluwer Academic Publishers, pp.531 - 552, 2004, 9781402027024. ⟨hal-03610885⟩

Share

Metrics

Record views

3